An efficient approach to enhance memory reliability

摘要

With the development of modern technology, soft error rate is increasing dramatically. Subsequently multiple bit upset is transforming into a critical issue for providing reliability of memories. Several methods are used to prevent soft errors. However, the rates of error detection and correction in these methods are very poor. This paper presents an efficient approach to detect and correct soft errors to enhance memory reliability. This method can detect and correct 100% error for any size of data bits. Experimental studies show how the proposed method out performs existing methods.