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EXTRACTING GATE UTILIZATION FACTORS

机译:提取门的利用率

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摘要

In the last several years a concerted effort has been made by the safeguards community to re-examine the theory and practice of neutron multiplicity counting. This has led to a renewed interest in the extraction and application of deadtime corrected net Singles, Doubles, Triples, Quads and Pents in various ways complementary to the usual approach based on event triggered multiplicity shift register time correlation analysis. If we are to invert these rates for item parameters, such as ~(240)Pu-effective mass, (α,n)/(SF,n)-ratio, and leakage multiplication, we also need ways to obtain and confirm the corresponding detector model parameters including the rate-extraction-method-specific gate utilization factors. The gate utilization factor is the fraction of correlated events of a given order on the pulse train that are counted by the finite coincidence gate. In this work we provided the expressions needed to extract gate utilization factors for signal triggered shift register time correlation analysis (MIXed) and randomly triggered inspection (RTI) rates using fast accidental sampling. These are then applied to characterization data acquired using ~(252)Cf for the LANL ENMC (Epithermal Neutron Multiplicity Counter). The extrapolated infinite gate rates obtained using different approaches are compared as a basic test of instrument non-ideal behavior and self-consistency.
机译:在过去的几年中,保障界共同努力重新审查中子多重计数的理论和实践。这引起了人们对以死点校正的净单,双,三重,四和四分位数的提取和应用的新兴趣,这是对基于事件触发的多重移位寄存器时间相关性分析的常规方法的补充。如果要对项参数(例如〜(240)Pu有效质量,(α,n)/(SF,n)-比率和泄漏乘积)的这些比率求逆,我们还需要一些方法来获取和确认相应的比率。检测器模型参数,包括速率提取方法特定的门利用率。门利用因子是由有限重合门计算的脉冲序列上给定阶数的相关事件的分数。在这项工作中,我们提供了提取门利用因子所需的表达式,以进行信号触发的移位寄存器时间相关性分析(MIXed)和使用快速意外采样的随机触发检查(RTI)率。然后将这些数据应用于使用〜(252)Cf为LANL ENMC(Epithermal Neutron Multiplicity Counter)获得的表征数据。比较使用不同方法获得的外推无限门速率,作为对仪器非理想行为和自洽性的基本测试。

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