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A CMOS analog front-end for driving a high-speed SAR ADC in low-power ultrasound imaging systems

机译:用于在低功率超声成像系统中驱动高速SAR ADC的CMOS模拟前端

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In recent studies of ultrasound imaging systems, successive approximation register (SAR) analog-to-digital converters (ADCs) are suggested as an alternative architecture for low-power ultrasound receiver integrated circuits. However, the sampling period of a high-speed SAR ADC is very short - less than a few nanoseconds. This results in the need of a very wide unity-gain bandwidth of the amplifier in the anti-aliasing filter (AAF), and it also causes more serious kick-back noise. In this paper, a single-channel analog front-end (AFE) with a RC filter for a high-speed SAR ADC is presented. The RC filter relaxes the bandwidth requirement of the amplifier in the AAF by 16% and reduces kick-back noise coming from the ADC input. The proposed AFE is fabricated in 0.18μm CMOS process. The design achieves 5.05nV/√Hz input-referred noise density and the voltage gain is controlled in the range of [-3.02, 30.6] dB in a linear-in-dB scale with 16 steps by a 4-bit digital code. Our AFE circuit consumes 30mA from a 1.8V supply.
机译:在超声成像系统的最新研究中,提出了逐次逼近寄存器(SAR)模数转换器(ADC)作为低功耗超声接收器集成电路的替代架构。但是,高速SAR ADC的采样周期非常短-不到几纳秒。这导致在抗混叠滤波器(AAF)中需要非常宽的放大器单位增益带宽,并且还会引起更严重的反冲噪声。本文提出了一种用于高速SAR ADC的带RC滤波器的单通道模拟前端(AFE)。 RC滤波器将AAF中放大器的带宽要求降低了16%,并降低了来自ADC输入的反冲噪声。拟议的AFE采用0.18μmCMOS工艺制造。该设计可达到5.05nV /√Hz的输入参考噪声密度,并且通过4位数字代码以16步的线性dB刻度将电压增益控制在[-3.02,30.6] dB范围内。我们的AFE电路从1.8V电源消耗30mA电流。

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