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A CRC-Based Concurrent Fault Detection Architecture for Galois/Counter Mode (GCM)

机译:Galois /计数器模式(GCM)的基于CRC的并行故障检测体系结构

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The Galois/Counter Mode (GCM) is a recently adopted mode of operation for symmetric key cryptography to provide both data authenticity and confidentiality. To improve the reliability of hardware implementations of the GCM module, we propose a novel multiple-bit fault detection architecture for hardware implementation of the GCM module using cyclic redundancy check (CRC) codes. By changing the degree of the CRC generating polynomial, one can select the number of parity bits used in the fault detection scheme based on the available resources and required overheads. We derive new formulations for the corresponding fault-detection scheme for the entire GCM loop. Then, we provide FPGA implementation and fault coverage simulation results for different CRC generating polynomials. We show that using six parity bits, one can achieve high fault coverage of close to 100% with the critical path delay overhead of 23% and area overhead of 10.9% while the false alarm is 0.12%.
机译:Galois /计数器模式(GCM)是对称密钥密码术最近采用的一种操作模式,可同时提供数据的真实性和机密性。为了提高GCM模块的硬件实现的可靠性,我们提出了一种新的多位故障检测架构,用于使用循环冗余校验(CRC)代码的GCM模块的硬件实现。通过更改CRC生成多项式的次数,可以基于可用资源和所需开销选择故障检测方案中使用的奇偶校验位的数量。我们为整个GCM回路的相应故障检测方案得出了新的公式。然后,我们提供了针对不同CRC生成多项式的FPGA实现和故障覆盖率仿真结果。我们显示,使用六个奇偶校验位,可以实现接近100%的高故障覆盖率,关键路径延迟开销为23%,区域开销为10.9%,而误报率为0.12%。

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