Low-energy Heavy-ion Implantation of Crop Seeds to Induce a Broad Spectrum of High-yield-based Mutation of Thai Rice

摘要

Low-energy (tens keV) heavy-ion implantation was applied as a novel mutagenic tool for high-yield-based broad-spectrum mutation breeding of Thai local rice. Seeds of Thai rice KDML105 and its ion-beam-induced primary mutant BKOS6 were implanted with tens-keV mixed nitrogen ions. In M1 generation, a high variation rate of 0.4% with the photoperiod-insensitivity potential was obtained. In subsequent generations, mutants with a broad spectrum of phenotypic variations dominantly supporting the high yield potential were selected and studied for the mutation stability till M5 generation. The mutants possessing not only high crop yields but also other properties improved or altered in the grains are reported and described. Physics involved is discussed.