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Fabrication process of a TSV interposer for radio frequency chip with integrated passive devices

机译:具有集成无源器件的射频芯片的TSV中介层的制造工艺

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This paper presents the fabrication process of a TSV interposer for RF chip with integrated passive devices. The passive devices fabricated by lift-off process of thin film include a thin-film resistor and three parallel-plate capacitors. The whole area of the interposer is 5.7 mm × 5mm and the thickness of interposer is only about 160um. Compared to traditional RF systems with discrete passive devices integrated on PCB, the area of the interposer is only about 1/27.
机译:本文介绍了用于集成有无源器件的RF芯片的TSV中介层的制造过程。通过薄膜剥离工艺制造的无源器件包括一个薄膜电阻器和三个平行板电容器。中介层的总面积为5.7 mm×5mm,中介层的厚度仅为160um。与在PCB上集成了分立无源器件的传统RF系统相比,插入器的面积仅为大约1/27。

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