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Switching performance of GaN-HEMT compared to Si-devices in new converters based on scalable converter cell structures

机译:基于可扩展转换器单元结构的新型转换器中的GaN-HEMT与Si器件相比的开关性能

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New modular converter topologies (MMC, MHF), will enable the use of lower voltage semiconductors where the applications are covered by Si-IGBTs, up to now. Especially, in the voltage class up to 650 volts, unipolar devices, based on silicon or GaN offer great potential for future progress. Converters based on switching cells and multilayer boards become attractive, because a high level of integration and ultra-low loss can be achieved. According to these trends, a converter design with focus on scalability, low stray inductance, integrated gate drive and integrated DC-link is presented. Measurement results with GaN-HEMT compared to high speed Si-IGBT with SiC-diode are explained.
机译:迄今为止,新的模块化转换器拓扑结构(MMC,MHF)将能够在应用被Si-IGBT覆盖的地方使用低压半导体。特别是在高达650伏的电压等级中,基于硅或GaN的单极器件为未来的发展提供了巨大的潜力。基于开关单元和多层板的转换器变得有吸引力,因为可以实现高集成度和超低损耗。根据这些趋势,提出了一种针对可扩展性,低杂散电感,集成栅极驱动和集成直流链路的转换器设计。解释了与具有SiC二极管的高速Si-IGBT相比,GaN-HEMT的测量结果。

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