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A method for quick estimation of optimum bulk bias voltages for SoC designs

机译:一种快速估计SoC设计的最佳体偏置电压的方法

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A method for early estimation of optimum bulk bias potential is proposed. The suggested strategy removes the requirement for synthesis based exploration, greatly reducing Turn Around Time (TAT). As the core of the method, we present a linear model for estimating the Energy Delay Product (EDP), which relies on characterization of Static and Dynamic Energy, as well as Delay for a single Inverter cell under different bulk bias operating conditions. This model weights these vectors using design constraint parameters such as switching activity and clock period. We have validated the model by means of statistical analysis. The method was then tested by comparison of Quality of Results (QoR) obtained from implementation of an open source System on a Chip (SoC) design, first using our predicted bias voltages and then using an estimate of the optimum found by exploration over a post layout annotated Netlist. Our method has achieved a 6.3% of improvement on EDP with a very low TAT.
机译:提出了一种早期估计最佳体偏置电势的方法。建议的策略消除了对基于合成的勘探的需求,从而大大减少了周转时间(TAT)。作为方法的核心,我们提出了一个线性模型来估计能量延迟乘积(EDP),该模型依赖于静态和动态能量的表征,以及单个逆变器单元在不同体积偏置工作条件下的延迟。该模型使用设计约束参数(如开关活动和时钟周期)对这些向量进行加权。我们已经通过统计分析验证了该模型。然后通过比较从实施开源芯片系统(SoC)设计获得的结果质量(QoR)来测试该方法,首先使用我们预测的偏置电压,然后使用在后期的探索中得出的最佳估计值布局注释的网表。我们的方法以非常低的TAT达到了EDP的6.3%的提高。

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