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Back contact band offset study of Mo-CZTS based solar cell structure by using XPS/UPS techniques

机译:利用XPS / UPS技术研究基于Mo-CZTS的太阳能电池结构的背接触带偏移

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The back contact issues of Cu2ZnSnS4 (CZTS) solar cells are rarely studied. The conventional back contact layers used for CZTS are molybdenum (Mo) and moly-disulfide (MoS2). In this paper, the band offset at the Mo/MoS2 interface is reported. The Mo/MoS2 interface was formed by annealing Mo foil in a sulfur rich ambient. XPS/UPS spectra were then obtained without exposing the sample to ambient atmosphere. The valence band maxima (VBM) and the core level binding energies were obtained to estimate the band alignment. Our results showed that a Schottky junction was formed at the Mo/MoS2 interface with a barrier height of 0.36eV. The valence band maximum at the interface was 0.84eV and the corresponding band bending was 0.11 eV at the interface. A band diagram of the Mo/MoS2 interface created with these values showed that the formation of MoS2 between Mo and CZTS layer would not be a barrier to the holes at least at the Mo-side of the Mo/MoS2/CZTS interface.
机译:很少研究Cu2ZnSnS4(CZTS)太阳能电池的背接触问题。用于CZTS的常规背接触层是钼(Mo)和二硫化钼(MoS2)。在本文中,报告了Mo / MoS2接口处的频带偏移。 Mo / MoS2界面是通过在富硫环境中对Mo箔进行退火而形成的。然后获得XPS / UPS光谱,而无需将样品暴露于环境气氛中。获得价带最大值(VBM)和核心能级结合能,以估计带对齐。我们的结果表明,在Mo / MoS2界面处形成了肖特基结,势垒高度为0.36eV​​。界面处的价带最大值为0.84eV,界面处的对应带弯曲为0.11eV。用这些值创建的Mo / MoS2界面的能带图显示,至少在Mo / MoS2 / CZTS界面的Mo侧,Mo和CZTS层之间形成MoS2不会成为空穴的障碍。

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