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Back contact band offset study of Mo-CZTS based solar cell structure by using XPS/UPS techniques

机译:基于XPS / UPS技术的Mo-CZTS基于MO-CZTS的背面接触带偏移研究

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摘要

The back contact issues of Cu2ZnSnS4 (CZTS) solar cells are rarely studied. The conventional back contact layers used for CZTS are molybdenum (Mo) and moly-disulfide (MoS2). In this paper, the band offset at the Mo/MoS2 interface is reported. The Mo/MoS2 interface was formed by annealing Mo foil in a sulfur rich ambient. XPS/UPS spectra were then obtained without exposing the sample to ambient atmosphere. The valence band maxima (VBM) and the core level binding energies were obtained to estimate the band alignment. Our results showed that a Schottky junction was formed at the Mo/MoS2 interface with a barrier height of 0.36eV. The valence band maximum at the interface was 0.84eV and the corresponding band bending was 0.11 eV at the interface. A band diagram of the Mo/MoS2 interface created with these values showed that the formation of MoS2 between Mo and CZTS layer would not be a barrier to the holes at least at the Mo-side of the Mo/MoS2/CZTS interface.
机译:Cu2ZNSN4(CZTS)太阳能电池的后接触问题很少研究。用于CZT的常规背部接触层是钼(MO)和摩尔二硫化物(MOS2)。在本文中,报道了MO / MOS2接口处的带偏移。 Mo / MOS2接口是通过在富含富硫环境中的MO箔而形成的。然后获得XPS / UPS光谱而不将样品暴露于环境气氛。获得价带最大值(VBM)和核心水平绑定能量以估计带对准。我们的研究结果表明,在Mo / MOS2接口处形成肖特基结,屏障高度为0.36eV​​。界面处的价带最大值为0.84EV,相应的带弯曲在界面处为0.11eV。用这些值创建的MO / MOS2接口的带图表明,在MO和CZTS层之间的MOS2的形成是至少在MO / MOS2 / CZT界面的MO-侧的孔的屏障。

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