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Significantly improved carrier lifetime and reduced interface recombination velocity for CdTe/MgCdTe double heterostructures

机译:CdTe / MgCdTe双异质结构显着提高了载流子寿命并降低了界面重组速度

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The carrier lifetime of CdTe/MgCdTe double heterostructures has been enhanced significantly up to 2.1 μs through using 30 nm MgCdTe barriers. Temperature-dependent photoluminescence measurements indicate that the radiative recombination contributes significantly to the total recombination at room temperature, and the internal quantum efficiency is estimated to be 40 %. A radiative and a non-radiative lifetimes have thus been calculated to be 5.25 μs and 3.5 μs, respectively. The interface recombination velocity of CdTe/MgCdTe is determined to be smaller than 2.7 cm/s, which is better or very close to the best values reported for GaAs/AlGaAs and GaAs/GaInP double heterostructures.
机译:通过使用30 nm MgCdTe势垒,CdTe / MgCdTe双异质结构的载流子寿命已显着提高,最高可达2.1μs。与温度有关的光致发光测量表明,辐射重组在室温下对总重组有显着贡献,内部量子效率估计为40%。因此,计算出辐射寿命和非辐射寿命分别为5.25μs和3.5μs。确定CdTe / MgCdTe的界面复合速度小于2.7 cm / s,这更好或非常接近于报道的关于GaAs / AlGaAs和GaAs / GaInP双异质结构的最佳值。

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