Soft fails due to LU stress of virtual power domains

机译：由于虚拟电源域的LU压力，软件失败

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A shut-down of IC was caused by current injection into a USB 2.0 pin. Root cause was a substrate current forced into a power rail supplied by a weak LDO. Connecting the guard rings to a robust VDD supply resolved the problem. As the failure could not be revealed by JESD78 testing, a modified latchup test setup is proposed.

机译：IC的关闭是由向USB 2.0引脚注入电流引起的。根本原因是由弱LDO提供的衬底电流被迫进入电源线。将保护环连接到坚固的VDD电源即可解决该问题。由于无法通过JESD78测试发现故障，因此提出了一种改进的闩锁测试设置。

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《Electrical Overstress/Electrostatic Discharge Symposium》|2015年|1-8|共8页
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Domanski Krzysztof; Gossner Harald;
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failure analysis; integrated circuit testing; peripheral interfaces; JESD78 testing; LU stress; USB 2.0 pin; current injection; integrated circuit shut-down; latchup stress; modified latchup test setup; power rail; soft fails; substrate current; virtual power domains; weak LDO; Couplings; Current measurement; Electrostatic discharges; Layout; Rails; Substrates; Universal Serial Bus;

机译：故障分析;集成电路测试;外围接口; JESD78测试; LU应力; USB 2.0引脚;电流注入;集成电路关闭;闩锁应力;修改的闩锁测试设置;电源线;软故障;基板电流;虚拟电源域;弱LDO;耦合;电流测量;静电放电;布局;导轨;基板;通用串行总线;

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专利

1. The Lu Qi-Keng conjecture fails for strongly convex algebraic complete Reinhardt domains in C-n (n >= 3) [J] . Anh NV. Proceedings of the American Mathematical Society . 2000,第6期

机译：对于C-n（n> = 3）中的强凸代数完整Reinhardt域，Lu Qi-Keng猜想失败
2. Active ESD Protection Design for Interface Circuits Between Separated Power Domains Against Cross-Power-Domain ESD Stresses [J] . Shih-Hung Chen, Ming-Dou Ker, Hsiang-Pin Hung IEEE transactions on device and materials reliability . 2008,第3期

机译：跨电源域ESD应力的独立电源域之间接口电路的有源ESD保护设计
3. Trier Social Stress Test in vivo and in virtual reality: Dissociation of response domains [J] . Shiban Youssef, Diemer Julia, Brandl Simone, International journal of psychophysiology: official journal of the International Organization of Psychophysiology . 2016,第Null期

机译：体内和虚拟现实中的Trier社会压力测试：响应域的分离
4. Soft fails due to LU stress of virtual power domains [C] . Domanski Krzysztof, Gossner Harald Electrical Overstress/Electrostatic Discharge Symposium . 2015

机译：由于虚拟电源域的鲁应力，软盘
5. PHiLOSoftware: A Low Power, High Performance, Reliable, and Secure Virtualization Layer for On-Chip Software-Controlled Memories. [D] . Bathen, Luis Angel D. 2012

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7. The Lu Qi-Keng conjecture fails for strongly convex algebraic complete Reinhardt domains in $mathbb {C}^n (n ge 3)$ [O] . Nguyên Viêt Anh 1999

机译：鲁奇乐猜想在$ mathbb {c} ^ n （n ge 3）$中失败了强烈的凸起代数完整的Reinhardt域。^ n （n ge 3）$

Soft fails due to LU stress of virtual power domains

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