An approach to generate test signals for analog circuits — A control-theoretic perspective

摘要

This paper presents a control-theoretic driven approach to the automatic generation of test signals for analog circuits or systems. It is based on the adaption of a tracking control structure for the task of generating test signals aimed at manufacturing test for a finished circuit design. The approach will be derived and its functionality is demonstrated using circuit examples. The integration of the proposed approach within a more general test development procedure for improving the fault coverage is explained.