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Clarification of Cu rich phase in SAC/FeNi solder joint

机译:澄清SAC / FeNi焊点中的富Cu相

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In this study, interfacial reaction of SAC/FeNi solder joints is investigated, and the Cu-rich IMC was clarified according to scanning electron microscopy (SEM) and transmission electron microscopy (TEM) observations. At SAC/27Fe73Ni interface, Cu rich IMC is rod-like dispersing in the solder. On the other hand, at the interface of SAC/55Fe45Ni solder joints, Cu rich IMC has an island-shape. From the EDS analysis, the Cu rich IMC is possibly CuSn with Fe and Ni solid solutionized. However, the morphology of this Cu rich IMC differs from CuSn formed in the same condition of SAC/Cu solder joint greatly. In order to identify this Cu rich IMC precisely, electron diffraction analysis was carried out using TEM on the cross section sample of solder joints. Through sample tilting, a series of selected area electron diffraction (SEAD) patterns of the Cu rich IMC were obtained, which can be indexed with η-CuSn structure exactly. Therefore, the Cu-rich IMC formed at the interface of SAC/FeNi solder joints was clarified as η-(Cu,Ni)Sn with hexagonal crystal structure.
机译:在这项研究中,研究了SAC / FeNi焊点的界面反应,并根据扫描电子显微镜(SEM)和透射电子显微镜(TEM)的观察澄清了富铜的IMC。在SAC / 27Fe73Ni界面处,富Cu的IMC呈棒状分散在焊料中。另一方面,在SAC / 55Fe45Ni焊点的界面处,富Cu的IMC呈岛状。从EDS分析中,富铜的IMC可能是固溶有铁和镍的CuSn。但是,这种富含Cu的IMC的形态与在相同的SAC / Cu焊点条件下形成的CuSn大不相同。为了准确地识别这种富含铜的IMC,使用TEM对焊点的横截面样品进行了电子衍射分析。通过样品倾斜,获得了一系列富铜IMC的选择区域电子衍射(SEAD)图,可以用η-CuSn结构精确地标引。因此,在SAC / FeNi焊点的界面处形成的富Cu IMC被澄清为具有六方晶体结构的η-(Cu,Ni)Sn。

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