As process technology continues scaling, low power and reliability of integrated circuits are becoming more critical than ever before. Particularly, due to the reduction of node capacitance and operating voltage for low power consumption, it makes the circuits more sensitive to high-energy particles induced soft errors. In this paper, a soft-error tolerant latch called TSPC-SEH is proposed for soft error tolerance with low power consumption. The simulation results show that the proposed TSPC-SEH latch can achieve up to 42% power consumption reduction and 54% delay improvement compared to the existing soft error tolerant SEH and DICE designs.
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