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Common-Mode (CM) noise suppression of serializer/deserializer (SERDES) transmitters based on parallel impedance scaled stages (Invited paper)

机译:基于并行阻抗缩放阶段的序列化器/解串器(SERDES)发射机的共模(CM)噪声抑制(邀请纸)

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The rise/fall time mismatch in a differential signal is responsible for a serious common-mode (CM) issue in high-speed CMOS serializer/deserializer (SERDES) transmitters (Txs). The non-linear parasitic impedance variations of the switching devices and differences in parasitic impedances in the charging and discharging loop produce deterministic spurs on the CM voltage that generate certain spectral tones at twice the Nyquist frequency, causing the electromagnetic compatibility (EMC) failure. The CM radiation is generally more significant than differential-mode (DM) radiation, and therefore suppressing CM noise is essential for improving EMC performance. This paper presents a new circuit design perspective to address the CM noise issue in a source-series terminated (SST) output driver by calibrating parallel impedance scaled SST stages. Simulated in a 65-nm CMOS process, our results indicate that adjusting the MOS devices circumvents the CM noise by more than 65% in the worst case scenario as it affects most of the output CM noise profile.
机译:在差分信号的上升/下降时间的失配是负责在高速CMOS串行器/解串器(SERDES)发射机严重的共模(CM)的问题(TXS)。开关装置和在寄生阻抗的差异在充电和放电循环产生确定性的非线性寄生阻抗变化骨刺上产生在奈奎斯特频率的两倍某些频谱音调,使电磁兼容性(EMC)故障CM电压。所述CM辐射通常比差模(DM)辐射更显著,因此抑制共模噪声是用于改进EMC性能是必不可少的。本文提出了一种新的电路设计的角度来看,以解决在源极串联端接(SST)通过校准并联阻抗缩放SST阶段的输出驱动器的共模噪声的问题。模拟在65纳米CMOS工艺,我们的结果表明,超过65 %,在最坏的情况下调节所述MOS器件绕开CM噪声,因为它影响大部分输出CM噪声分布的。

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