Research on the Test System for Electrical Parameters of Relay Based on STM32

摘要

The current test system for electrical parameters of relay, mainly with the 51 series MCU as the central processing unit, peripheral components are various, running speed is limited, and judging the failure of relay only rely on testing the contact resistance exceeds the standard or not, testing parameter is single. Foreign technology on research and development of test system for relay's electrical parameters is mature, but the cost is higher. Thus, in this paper, we study a kind of test system for relay's electrical parameters with STM32 MCU as the central processing unit, which can realize to test the relay's electrical parameters such as coil resistance, contact resistance, suction voltage, release voltage, suction time, release time, arc time and so on. This paper mainly discusses the design principle and hardware structure, finally obtained test data by the experiment, the data show that the test system has the advantages of fast running, stable performance, simple design, and has a certain market value.