首页> 外文会议>Berkeley Symposium on Energy Efficient Electronic Systems >Challenges of fulfilling the promise of tunnel FETs
【24h】

Challenges of fulfilling the promise of tunnel FETs

机译:兑现隧道FET承诺的挑战

获取原文

摘要

Summary form only given. III-V Hetero-junction Tunnel FET (HTFET) are promising candidates for supply voltage scaling down to sub-0.5V due to their promise of sub-kT/q switching without compromising on-current (I). Recently n-type III-V HTFET with reasonable I and sub-kT/q switching at V=0.5V have been demonstrated [1]. However, steep switching performance of III-V HTFET till date has been limited to range of drain current (I) spanning over less than a decade. Here, we analyze primary roadblocks in the path towards achieving steep switching performance in III-V HTFET. Temperature dependent current-voltage measurements on III-V HTFET are performed and calibrated numerical simulations are used to quantify the metrics towards realizing sub-kT/q switching over large I range.
机译:仅提供摘要表格。由于III-V异质结隧道FET(HTFET)承诺在不影响导通电流(I)的情况下实现亚kT / q切换,因此有望将电源电压缩减至0.5V以下。最近,已经证明在V = 0.5V时具有合理的I和sub-kT / q切换的n型III-V HTFET [1]。然而,直到现在,III-V HTFET的陡峭开关性能一直被限制在超过不到十年的漏极电流(I)范围内。在这里,我们分析了实现III-V HTFET陡峭开关性能的主要障碍。在III-V HTFET上执行与温度相关的电流-电压测量,并使用校准的数值模拟来量化指标,以在大I范围内实现亚kT / q切换。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号