Thermographic control of organic solar cells

摘要

This paper presents the results from research on the application of Infrared Thermography (IRT) for sub-surface defect evaluation in organic solar cells (OSC). The research was carried out with the three types of test samples: OSC without defects, with unknown and with known types of defects and evaluated localized defects. Passive as well as active thermography for the sub-surface defect detection of selected test OSC modules is applied. An identification of sub-surface defects, connected with the inhomogeneity of the active film thickness, dislocation of the masks during the sample preparation, leakage currents between neighbor electrodes, and structural defects was carried out. The results show a successful application of IRT for fault detection and localization during fabrication process and during the diagnostic control of such modules.