Electrical Overstress robustness and test method for ICs

摘要

With electronics technology improvements, Electrical OverStress (EOS) failures due to Over Voltage Stress (OVS) event became the current issue instead of ElectroStatic Discharge (ESD). To better specify devices Absolute Maximum Rating (AMR), this study deepens the knowledge of robustness threshold and helps understanding failure mechanisms on ICs components besides ESD.