Functional block extraction for hardware security detection using time-integrated and time-resolved emission measurements

摘要

This paper presents a novel and powerful methodology for extracting functional blocks in hardware security and Trojan detection applications. The method is based on our proposed tester-based optical methodology that combines different test patterns, time-integrated and time-resolved emission measurements to identify and localize logic state changes and functional block activity inside a chip in a non invasive fashion. Detailed examples using a mixed-signal chip are presented and discussed to explain our proposed method.