首页> 外文会议>European Photovoltaic Solar Energy Conference and Exhibition >RESULTS OF THE SOPHIA MODULE INTERCOMPARISON PART-1: STC, LOW IRRADIANCE CONDITIONS AND TEMPERATURE COEFFICIENTS MEASUREMENTS OF C-SI TECHNOLOGIES
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RESULTS OF THE SOPHIA MODULE INTERCOMPARISON PART-1: STC, LOW IRRADIANCE CONDITIONS AND TEMPERATURE COEFFICIENTS MEASUREMENTS OF C-SI TECHNOLOGIES

机译:SOPHIA模组比较结果-第一部分:STC,低辐照度条件和C-SI技术的温度系数测量

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The results of a measurement intercomparison between eleven European laboratories measuring PV energy relevant parameters are reported. The purpose of the round-robin was to assess the uncertainty analyses of the participating laboratories on c-Si modules and to establish a baseline for the following thin-film round-robin. Alongside the STC measurements, low irradiance conditions (200W/m~2) and temperature coefficients measurements were performed. The largest measurement deviation from the median at STC was for HIT modules from -3.6% to +2.7% in P_(MAX). but in agreement with the stated uncertainties of the participants. This was not the case for low irradiance conditions and temperature coefficients measurements with some partners underestimating their uncertainties. Larger deviations from the median from -5% to +3% in P_(MAX) at low irradiance conditions and -6.6% to +18.3% for the P_(MAX) temperature coefficient were observed. The main sources of uncertainties contributing to the spread in measurements were the RC calibration, mismatch factor and capacitive effects at STC and low irradiance conditions as well as the additional light inhomogeneity for the latter. The uncertainty in the junction temperature and the temperature deviation across the module were the major contributors for temperature coefficients measurements.
机译:报告了11个欧洲实验室测量PV能量相关参数的测量比对结果。循环法的目的是评估参与实验室对c-Si模块的不确定性分析,并为随后的薄膜循环法建立基线。除STC测量外,还进行了低辐照条件(200W / m〜2)和温度系数的测量。与HTC模块相比,STC中与中值的最大测量偏差在P_(MAX)中从-3.6%到+ 2.7%。但与参与者陈述的不确定性一致。对于低辐照条件和温度系数测量,情况并非如此,一些合作伙伴低估了其不确定性。在低辐照条件下,P_(MAX)的中位数偏差从-5%到+ 3%,P_(MAX)温度系数的偏差从-6.6%到+ 18.3%。导致测量范围扩展的不确定性的主要来源是RC校准,STC和低辐照条件下的失配因数和电容效应,以及后者的额外光不均匀性。结温的不确定性和整个模块的温度偏差是温度系数测量的主要因素。

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