Implementation of Certified 150-Ω Voltage Probe for IEC 61967-4 Conducted Electromagnetic Emission Measurement

摘要

A 150-Ω probe which fully complied with the IEC standard 61967-4 is proposed for the conducted emission testing at IC level. The 150-Ω direct coupling method is reviewed, and the concern of precise measurement and the property of easy to use is discussed. The 150-Ω network is implemented by the integrated passive device (IPD) process instead of surface-mount devices (SMDs). With the reduced parasitic effect, the proposed 150-Ω probe is verified to fulfill the specifications of IEC standard which make the characterization of EMI at IC level guarantee the high precision and high repeatability.