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2.4kV GaN Polarization Superjunction Schottky Barrier Diodes on semi-insulating 6H-SiC substrate

机译:半绝缘6H-SiC衬底上的2.4kV GaN极化超结肖特基势垒二极管

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This paper reports the performance and electrical characterization results of high voltage Polarization Superjunction (PSJ) GaN Schottky Barrier Diodes (SBD) on semi-insulating 6H-SiC substrate for the first time. Fabricated PSJ SBDs with drift length of 25 μm show low on-set voltage of ∼ 0.4V, high reverse blocking voltage (VBR) of ∼ 2400V, specific on-state resistance (RON.A) of ∼ 14 mΩ.cm2 and a Power Device Figure of Merit (PDFOM = VBR2/RON.A) of ∼ 400 MW/cm2.
机译:本文首次报道了在半绝缘6H-SiC衬底上的高压极化超结(PSJ)GaN肖特基势垒二极管(SBD)的性能和电学表征结果。漂移长度为25μm的预制PSJ SBD具有低至约0.4V的启动电压,高至2400V的反向反向阻断电压(VBR),约14mΩ.cm2的比通态电阻(RON.A)和功率装置优值(PDFOM = VBR2 / RON.A)约为400 MW / cm2。

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