Automated and Reusable IP Functional Test Rule Development across Multiple IP Instances within and across Asic Designs

摘要

Effective mixed-signal IP or core testing using an automated test methodology that is reusable across multiple IP instances, both within an ASIC and across various ASICs, is desirable for minimizing manufacturing test time, design changes for test, and maximizing yield while maintaining SPQL status. This paper presents an extended summary of two aspects of an illustrative approach to make functional test rules reusable, namely: (i) automatic scheduling of functional manufacturing test for multiple instances of an embedded IP or core across various ASIC designs, and (ii) automatic identification of master or slave IP among multiple IP instances, in any ASIC, for sharing a calibration reference resistor.