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North Atlantic Test Workshop

召开年：2014
召开地：Binghampton, NY(US)
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1.Local Repair Signature Handling for Repairable Memories

机译：可修复内存的本地修复签名处理
- 作者：Tekumalla Ramesh;Krishnamoorthy Prakash
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- memory;
- repair;
- signature and redundancy;
2.On Handling Memory Scan Chains

机译：关于处理内存扫描链
- 作者：Bansal Surbhi;Mendhalkar Aviansh;Tekumalla Ramesh
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- SOC;
- memory;
- scan capture and test generation;
- scan chains;
- timing;
3.On-chip Clock Testing and Frequency Measurement

机译：片上时钟测试和频率测量
- 作者：Tekumalla Ramesh;Krishnamoorthy Prakash
- 会议名称：《North Atlantic Test Workshop》 | 2014年
4.Innovative Antenna Chamber Characterization

机译：创新的天线腔室表征
- 作者：Lam Tommy
- 会议名称：《North Atlantic Test Workshop》 | 2014年
5.Test Compression Improvement with EDT Channel Sharing in SoC Designs

机译：利用SoC设计中的EDT通道共享来改善测试压缩
- 作者：Huang Yu;Kassab Mark;Jahangiri Jay;Rajski Janusz;Cheng Wu-Tung;Han Dongkwan;Kim Jihye;Chung Kun Young
- 会议名称：《North Atlantic Test Workshop》 | 2014年
6.When Optimized N-Detect Test Sets are Biased: An Investigation of Cell-Aware-Type Faults and N-Detect Stuck-At ATPG

机译：当优化的N检测器测试集存在偏差时：对单元感知型故障和N检测器卡在ATPG的调查
- 作者：Zhang Fanchen;Thornton Micah;Dworak Jennifer
- 会议名称：《North Atlantic Test Workshop》 | 2014年
7.Power System Fault Modeling/Simulation Protective Relay Testing and Simulation

机译：电力系统故障建模/仿真保护继电器测试与仿真
- 作者：Tang Grace
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- commissioning;
- fault simulation;
- modeling;
- power systems;
- protection and control;
- relay;
- testing;
8.CSST: An Efficient Secure Split-Test for Preventing IC Piracy

机译：CSST：防止IC盗版的有效安全拆分测试
- 作者：Rahman Md.Tauhidur;Forte Domenic;Shi Quihang;Contreras Gustavo K.;Tehranipoor Mohammad
- 会议名称：《North Atlantic Test Workshop》 | 2014年
9.Design and Test of Adaptive Computing Fabrics for Scalable and High-Efficiency Cognitive SoC Applications

机译：适用于可扩展和高效认知SoC应用的自适应计算结构的设计和测试
- 作者：Nsame Pascal;Bois Guy;Savaria Yvon
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- Cognitive SoC;
- Adaptive Computing Fabric;
- Reliable Communication;
- Embedded Test Generation;
10.Optimal Selection of ATE Frequencies for Test Time Reduction Using Aperiodic Clock

机译：使用非周期性时钟的ATE频率的最佳选择以减少测试时间
- 作者：Gunasekar Sindhu;Agrawal Vishwani D.
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- Adaptive clocking;
- Aperiodic clock;
- Automatic Test Equipment;
- Scan test;
- Test time reduction;
11.A New Test Vector Search Algorithm for a Single Stuck-at Fault Using Probabilistic Correlation

机译：基于概率相关性的单卡滞故障测试向量搜索新算法
- 作者：Venkatasubramanian Muralidharan;Agrawal Vishwani D.
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- Probabilistic correlation;
- test pattern generator;
- quantum algorithms;
- unsuccessful test vectors;
12.Pattern Generation for Post-Silicon Timing Validation Considering Power Supply Noise

机译：考虑电源噪声的硅后时序验证模式生成
- 作者：Zhang Tengteng;Gao Yukun;Walker D.M.H.
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- post-silicon validation;
- power supply noise;
- pseudo functional test;
13.Delay Test of Embedded Memories

机译：嵌入式存储器的延迟测试
- 作者：Gao Yukun;Zhang Tengteng;Chakraborty Swati;Walker D.M.H.
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- ATPG;
- KLPG;
- Memory Test;
- Path Delay Test;
14.A Comprehensive Evaluation of Functional Programs for Power-Aware Test

机译：电力意识测试功能程序的综合评估
- 作者：Touati A.;Bosio A.;Dilillo L.;Girard P.;Todri-Sanial A.;Virazel A.;Bernardi P.
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- Power Aware Test;
- Functional and Structural test;
- ATPG;
15.Asynchronous Fault Detection in IEEE P1687 Instrument Network

机译：IEEE P1687仪表网络中的异步故障检测
- 作者：Shibin Konstantin;Devadze Sergei;Jutman Artur
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- IJTAG;
- P1687;
- asynchronous fault detection;
- fault management;
16.A Comprehensive Evaluation of Functional Programs for Power-Aware Test

机译：综合评估动力感知测试功能方案
- 作者：Touati A.;Bosio A.;Dilillo L.;Girard P.;Todri-Sanial A.;Virazel A.;Bernardi P.
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- Power Aware Test;
- Functional and Structural test;
- ATPG;
17.On-chip Clock Testing and Frequency Measurement

机译：片上时钟测试和频率测量
- 作者：Tekumalla Ramesh;Krishnamoorthy Prakash
- 会议名称：《North Atlantic Test Workshop》 | 2014年
18.Design and Test of Adaptive Computing Fabrics for Scalable and High-Efficiency Cognitive SoC Applications

机译：可扩展和高效认知SOC应用的自适应计算面料的设计与测试
- 作者：Nsame Pascal;Bois Guy;Savaria Yvon
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- Cognitive SoC;
- Adaptive Computing Fabric;
- Reliable Communication;
- Embedded Test Generation;
19.Asynchronous Fault Detection in IEEE P1687 Instrument Network

机译：IEEE P1687仪器网络中的异步故障检测
- 作者：Shibin Konstantin;Devadze Sergei;Jutman Artur
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- IJTAG;
- P1687;
- asynchronous fault detection;
- fault management;
20.Pattern Generation for Post-Silicon Timing Validation Considering Power Supply Noise

机译：考虑电源噪声的硅后时序验证的模式生成
- 作者：Zhang Tengteng;Gao Yukun;Walker D.M.H.
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- post-silicon validation;
- power supply noise;
- pseudo functional test;
21.Innovative Antenna Chamber Characterization

机译：创新天线室特征
- 作者：Lam Tommy
- 会议名称：《North Atlantic Test Workshop》 | 2014年
22.On Handling Memory Scan Chains

机译：处理记忆扫描链
- 作者：Bansal Surbhi;Mendhalkar Aviansh;Tekumalla Ramesh
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- SOC;
- memory;
- scan capture and test generation;
- scan chains;
- timing;
23.Test Compression Improvement with EDT Channel Sharing in SoC Designs

机译：通过SOC设计中的EDT信道共享测试压缩改进
- 作者：Huang Yu;Kassab Mark;Jahangiri Jay;Rajski Janusz;Cheng Wu-Tung;Han Dongkwan;Kim Jihye;Chung Kun Young
- 会议名称：《North Atlantic Test Workshop》 | 2014年
24.Power System Fault Modeling/Simulation Protective Relay Testing and Simulation

机译：电力系统故障建模/仿真保护继电器测试和仿真
- 作者：Tang Grace
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- commissioning;
- fault simulation;
- modeling;
- power systems;
- protection and control;
- relay;
- testing;
25.A New Test Vector Search Algorithm for a Single Stuck-at Fault Using Probabilistic Correlation

机译：使用概率相关性的单个卡住故障的新测试矢量搜索算法
- 作者：Venkatasubramanian Muralidharan;Agrawal Vishwani D.
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- Probabilistic correlation;
- test pattern generator;
- quantum algorithms;
- unsuccessful test vectors;
26.CSST: An Efficient Secure Split-Test for Preventing IC Piracy

机译：CSST：防止IC盗版的有效安全拆分测试
- 作者：Rahman Md.Tauhidur;Forte Domenic;Shi Quihang;Contreras Gustavo K.;Tehranipoor Mohammad
- 会议名称：《North Atlantic Test Workshop》 | 2014年
27.When Optimized N-Detect Test Sets are Biased: An Investigation of Cell-Aware-Type Faults and N-Detect Stuck-At ATPG

机译：优化的N检测测试集有偏置：对ATPG的细胞感知型故障和N检测的调查
- 作者：Zhang Fanchen;Thornton Micah;Dworak Jennifer
- 会议名称：《North Atlantic Test Workshop》 | 2014年
28.Optimal Selection of ATE Frequencies for Test Time Reduction Using Aperiodic Clock

机译：使用非周期性时钟测试时间减少的ATE频率的最佳选择
- 作者：Gunasekar Sindhu;Agrawal Vishwani D.
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- Adaptive clocking;
- Aperiodic clock;
- Automatic Test Equipment;
- Scan test;
- Test time reduction;
29.Delay Test of Embedded Memories

机译：嵌入回忆的延迟测试
- 作者：Gao Yukun;Zhang Tengteng;Chakraborty Swati;Walker D.M.H.
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- ATPG;
- KLPG;
- Memory Test;
- Path Delay Test;
30.Local Repair Signature Handling for Repairable Memories

机译：适用于可修复的回忆的本地修复签名
- 作者：Tekumalla Ramesh;Krishnamoorthy Prakash
- 会议名称：《North Atlantic Test Workshop》 | 2014年
- memory;
- repair;
- signature and redundancy;
31.Hybrid Hierarchical and Modular Tests for SoC Designs

机译：SoC设计的混合分层和模块化测试
- 作者：Guoliang Li;Jun Qian;Qinfu Yang;Yuan Zuo;Rui Li;Yu Huang;Kassab Mark;Rajski Janusz
- 会议名称：《North Atlantic Test Workshop》 | 2015年
- EDT;
- Hierarchical Testing;
- Modular Testing;
- SoC Testing;
32.A Novel Failure Diagnosis Approach for Low Pin Count and Low Power Compression Architectures

机译：低引脚计数和低功率压缩架构的新型故障诊断方法
- 作者：Chillarige S.;Virdi S.;Malik A.;Chakravadhanula K.;Chickermane V.;Swenton J.;Vandling G.
- 会议名称：《North Atlantic Test Workshop》 | 2015年
- dft silicon diagnosis TAM;
33.Satisfiability-Based Analysis of Failing Traces during Post-silicon Debug

机译：硅胶调试期间，基于迹线的基于迹线分析
- 作者：Vali Amin;Nicolici Nicola
- 会议名称：《North Atlantic Test Workshop》 | 2015年
- Bug Localization;
- On-chip Trace Analysis;
- Root Cause Analysis;
- SAT-based;
- post silicon debug;
- post silicon validation;
- satisfiability;
34.Adaptive Mitigation of Radiation-Induced Errors and TDDB in Reconfigurable Logic Fabrics

机译：可重构逻辑织物中辐射诱导误差和TDDB的自适应缓解
- 作者：Al-Haddad Rawad;Oreifej Rashad S.;Zand Ramtin;Ejnioui Abdel;DeMara Ronald F.
- 会议名称：《North Atlantic Test Workshop》 | 2015年
35.At-Speed Path Delay Test

机译：在速度路径延迟测试
- 作者：Chakraborty Swati;Walker D.M.H.
- 会议名称：《North Atlantic Test Workshop》 | 2015年
- path delay test;
36.SoC TAM Design to Minimize Test Application Time

机译：SOC TAM设计，以最大限度地减少测试应用时间
- 作者：Huiting Zhang;Agrawal Vishwani D.
- 会议名称：《North Atlantic Test Workshop》 | 2015年
- DVFS;
- Keywords - SoC Test Scheduling;
- MILP;
- TAM Design;
- TAT;
- hardware and power constraints.;
37.Multivalued Logic for Reduced Pin Count and Multi-site SoC Testing

机译：减少针计数和多站点SOC测试的多增率逻辑
- 作者：Baohu Li;Agrawal Vishwani D.
- 会议名称：《North Atlantic Test Workshop》 | 2015年
- multi-site test;
- multi-value logic (MVL);
- reduced pin-count test (RPCT);
- system-on-chip (SoC) test;
- test compression;
38.Clock Domain Imbalances and Their Impact on Test Architecture

机译：时钟域不平衡及其对测试架构的影响
- 作者：Tekumalla Ramesh
- 会议名称：《North Atlantic Test Workshop》 | 2015年
- clock;
- design for test;
- test mode;
- yield;
39.An Industrial Case Study: PaRent (Parallel amp; Concurrent) Testing for Complex Mixed-Signal Devices

机译：工业案例研究：复杂混合信号设备的父级（并行和并发）测试
- 作者：Dworak Jennifer;Ping Gui;Khasawneh Qutaiba
- 会议名称：《North Atlantic Test Workshop》 | 2015年
- Concurrent Testing;
- Mixed-Signal Testing;
- Parallel Testing;
- Scheduling;
40.Complete Properties Extraction from Simulation Traces for Assertions Auto-generation

机译：用于断言自动生成的仿真迹线的完整属性提取
- 作者：Hanafy Mohamed;Said Hazem;Wahba Ayman M.
- 会议名称：《North Atlantic Test Workshop》 | 2015年
- assertion;
- coverage;
- binary decision tree;
41.Failures Guide Probabilistic Search for a Hard-to-Find Test

机译：失败指导概率搜索难以找到的测试
- 作者：Muralidharan Venkatasubramanian;Vishwani D. Agrawal
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- Circuit faults;
- Bars;
- Benchmark testing;
- Databases;
- Correlation;
- Complexity theory;
42.A Tuning Technique for Temperature and Process Variation Compensation of Power Amplifiers with Digital Predistortion

机译：具有数字预失真的功率放大器温度和过程变化补偿的调谐技术
- 作者：Hari Chauhan;Vlad Kvartenko;Marvin Onabajo
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- Tuning;
- Radio frequency;
- Predistortion;
- Linearity;
- Temperature;
- Baseband;
43.Using Existing Reconfigurable Logic in 3D Die Stacks for Test

机译：使用3D模堆中的现有可重构逻辑进行测试
- 作者：Fanchen Zhang;Yi Sun;Xi Shen;Kundan Nepal;Jennifer Dworak;Theodore Manikas;Ping Gui;R. Iris Bahar;Al Crouch;John Potter
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- Field programmable gate arrays;
- Three-dimensional displays;
- Table lookup;
- Through-silicon vias;
- Testing;
- Bandwidth;
44.Case Study of Testing a SoC Design with Mixed EDT Channel Sharing and Channel Broadcasting

机译：用混合EDT信道共享和信道广播测试SOC设计的案例研究
- 作者：Xiao Liu;Changkai Yu;Yu Qi;Yu Huang;James Fu
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- Broadcasting;
- Pins;
- Discrete Fourier transforms;
- Testing;
- Multicore processing;
- Logic gates;
- IP networks;
45.A 100MS/s 10-bit Split-SAR ADC with Capacitor Mismatch Compensation Using Built-In Calibration

机译：使用内置校准，具有电容器不匹配补偿的100ms / s 10位分裂SAR ADC
- 作者：Yongsuk Choi;Yong-Bin Kim;In-Seok Jung
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- Capacitors;
- Calibration;
- Capacitance;
- Registers;
- CMOS technology;
- Clocks;
- Power demand;
46.An Area Efficient 4Gb/s Half-Rate 3-Tap DFE with Current-Integrating Summer for Data Correction

机译：具有电流集成夏季的区域高效的4GB / S半速率3分接DFE，用于数据校正
- 作者：Chen Zhang;Gyunam Jeon;Yongsuk Choi;Yong-Bin Kim;Kyung Ki Kim
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- Decision feedback equalizers;
- Switches;
- Capacitors;
- Clocks;
- Multiplexing;
- Resistors;
47.Automated and Reusable IP Functional Test Rule Development across Multiple IP Instances within and across Asic Designs

机译：跨ASIC设计中的多个IP实例自动化和可重复使用的IP功能测试规则开发
- 作者：Malinky Ghosh;Kelly Ockunzzi
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- IP networks;
- Pins;
- Testing;
- Calibration;
- Job shop scheduling;
- Semiconductor device measurement;
- Manufacturing;
48.A 100MS/s 10-bit Split-SAR ADC with Capacitor Mismatch Compensation Using Built-In Calibration

机译：使用内置校准，具有电容器不匹配补偿的100ms / s 10位分裂SAR ADC
- 作者：Yongsuk Choi;Yong-Bin Kim;In-Seok Jung
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- Capacitors;
- Calibration;
- Capacitance;
- Registers;
- CMOS technology;
- Clocks;
- Power demand;
49.An Area Efficient 4Gb/s Half-Rate 3-Tap DFE with Current-Integrating Summer for Data Correction

机译：具有电流集成夏季的区域高效的4GB / S半速率3分接DFE，用于数据校正
- 作者：Chen Zhang;Gyunam Jeon;Yongsuk Choi;Yong-Bin Kim;Kyung Ki Kim
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- Decision feedback equalizers;
- Switches;
- Capacitors;
- Clocks;
- Multiplexing;
- Resistors;
50.Case Study of Testing a SoC Design with Mixed EDT Channel Sharing and Channel Broadcasting

机译：用混合EDT信道共享和信道广播测试SOC设计的案例研究
- 作者：Xiao Liu;Changkai Yu;Yu Qi;Yu Huang;James Fu
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- Broadcasting;
- Pins;
- Discrete Fourier transforms;
- Testing;
- Multicore processing;
- Logic gates;
- IP networks;
51.Failures Guide Probabilistic Search for a Hard-to-Find Test

机译：失败指导概率搜索难以找到的测试
- 作者：Muralidharan Venkatasubramanian;Vishwani D. Agrawal
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- Circuit faults;
- Bars;
- Benchmark testing;
- Databases;
- Correlation;
- Complexity theory;
52.Modeling Residual Life of an IC Considering Multiple Aging Mechanisms

机译：考虑多次老化机制的IC剩余寿命建模
- 作者：Md Nazmul Islam;Sandip Kundu
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- Aging;
- Integrated circuit modeling;
- Distribution functions;
- Temperature measurement;
- Degradation;
- Reliability;
53.RAPIDO Testing and Modeling of Assisted Write and Read Operations for SRAMs

机译：SRAM辅助写入和读取操作的RAPIDO测试和建模
- 作者：Joseph Nguyen;David Turgis;David Bonciani;Brice Lhomme;Yann Carminati;Olivier Callen;Guillaume Guirleo;Lorenzo Ciampolini;Gerard Ghibaudo
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- Random access memory;
- Integrated circuit modeling;
- Silicon;
- Vehicles;
- Semiconductor device modeling;
- Power demand;
- Sociology;
54.Automated and Reusable IP Functional Test Rule Development across Multiple IP Instances within and across Asic Designs

机译：跨ASIC设计中的多个IP实例自动化和可重复使用的IP功能测试规则开发
- 作者：Malinky Ghosh;Kelly Ockunzzi
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- IP networks;
- Pins;
- Testing;
- Calibration;
- Job shop scheduling;
- Semiconductor device measurement;
- Manufacturing;
55.A Tuning Technique for Temperature and Process Variation Compensation of Power Amplifiers with Digital Predistortion

机译：具有数字预失真的功率放大器温度和过程变化补偿的调谐技术
- 作者：Hari Chauhan;Vlad Kvartenko;Marvin Onabajo
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- Tuning;
- Radio frequency;
- Predistortion;
- Linearity;
- Temperature;
- Baseband;
56.Using Existing Reconfigurable Logic in 3D Die Stacks for Test

机译：使用3D模堆中的现有可重构逻辑进行测试
- 作者：Fanchen Zhang;Yi Sun;Xi Shen;Kundan Nepal;Jennifer Dworak;Theodore Manikas;Ping Gui;R. Iris Bahar;Al Crouch;John Potter
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- Field programmable gate arrays;
- Three-dimensional displays;
- Table lookup;
- Through-silicon vias;
- Testing;
- Bandwidth;
57.Enabling Debug in IoT Wireless Development and Deployment with Security Considerations

机译：在IOT无线开发和部署中启用调试，请通过安全考虑
- 作者：Amirhossein Shahshahani;Andrey Tolstikhin;Zeljko Zilic
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- Wireless communication;
- Communication system security;
- Internet of things;
- Debugging;
- Bluetooth;
- Protocols;
- Security;
58.RAPIDO Testing and Modeling of Assisted Write and Read Operations for SRAMs

机译：SRAM辅助写入和读取操作的RAPIDO测试和建模
- 作者：Joseph Nguyen;David Turgis;David Bonciani;Brice Lhomme;Yann Carminati;Olivier Callen;Guillaume Guirleo;Lorenzo Ciampolini;Gerard Ghibaudo
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- Random access memory;
- Integrated circuit modeling;
- Silicon;
- Vehicles;
- Semiconductor device modeling;
- Power demand;
- Sociology;
59.Modeling Residual Life of an IC Considering Multiple Aging Mechanisms

机译：考虑多次老化机制的IC剩余寿命建模
- 作者：Md Nazmul Islam;Sandip Kundu
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- Aging;
- Integrated circuit modeling;
- Distribution functions;
- Temperature measurement;
- Degradation;
- Reliability;
60.Enabling Debug in IoT Wireless Development and Deployment with Security Considerations

机译：在IOT无线开发和部署中启用调试，请通过安全考虑
- 作者：Amirhossein Shahshahani;Andrey Tolstikhin;Zeljko Zilic
- 会议名称：《North Atlantic Test Workshop》 | 2016年
- Wireless communication;
- Communication system security;
- Internet of things;
- Debugging;
- Bluetooth;
- Protocols;
- Security;