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Adaptive Mitigation of Radiation-Induced Errors and TDDB in Reconfigurable Logic Fabrics

机译:可重构逻辑织物中辐射诱导误差和TDDB的自适应缓解

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Self-reliance capabilities of mission-critical systems gain importance as technology scaling and logic capacity of SRAM-based reconfigurable devices increase. The Sustainable Modular Adaptive Redundancy Technique (SMART) is evaluated to optimize the reliability, availability, and energy efficiency of reconfigurable logic devices with a given area footprint. A Monte Carlo driven Continuous Markov Time Chain (CMTC) simulation is conducted to assess availability using runtime adaptation with SMART in comparison to conventional design-time static Triple Modular Redundancy (TMR) techniques. In harsh environments, adaptive redundancy is shown to improve system availability under lengthy repair times, and to a more significant degree under rapid recovery times. When compared to TMR, adaptive redundancy achieves power savings ranging from 22% to 29%, at a reduced area cost ranging from 17% to 24%, while maintaining comparable levels of availability.
机译:关键任务系统的自力更生能力是基于SRAM的可重新配置设备的技术缩放和逻辑容量增加的重要性。评估可持续模块化自适应冗余技术(SMART)以优化具有给定区域占地面积的可重构逻辑器件的可靠性,可用性和能效。蒙特卡洛驱动的连续马尔可夫时间链(CMTC)模拟进行了使用与传统的设计时静态三重模块化冗余(TMR)技术相比,使用运行时适应使用运行时调整进行评估。在恶劣的环境中,显示自适应冗余,以提高在冗长的修复时间下的系统可用性,并在快速恢复时间内更高的程度。与TMR相比,自适应冗余达到功率节约从22%到29%,降低的区域成本从17%到24%,同时保持可比的可用性水平。

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