Automatic defect classification of TFT-LCD panels using machine learning

摘要

Defect classification in the liquid crystal display (LCD) manufacturing process is one of the most crucial issues for quality control. To resolve this constraint, an automatic defect classification (ADC) method based on machine learning is proposed. Key features of LCD micro-defects are defined and extracted, and support vector machine is used for classification. The classification performance is presented through several experimental results.