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A study of using nonnegative matrix factorization to detect solder-voids from radiographic images of solder

机译:使用非负矩阵分解技术从焊锡射线图像中检测焊锡空隙的研究

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Accurate detection of voids in solder bumps on ball grid arrays (BGAs) is important for improving device quality. Radiographic imaging is commonly used to inspect BGA packages incorporate into LSI circuits. In the case of conventional method, imaging is normally done four times, and the images obtained are averaged to reduce noises. We have developed a nonnegative matrix factorization method for detecting solder-voids using only three radiographic images. Computer simulation demonstrated that it has the same level of accuracy as the conventional method.
机译:准确检测球栅阵列(BGA)上焊料凸块中的空隙对于提高设备质量非常重要。射线照相成像通常用于检查并入LSI电路的BGA封装。在常规方法的情况下,通常进行四次成像,并对获得的图像进行平均以减少噪声。我们已经开发出了一种非负矩阵分解方法,该方法仅使用三个射线照相图像来检测焊锡空隙。计算机仿真表明,它具有与传统方法相同的准确性。

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