ball grid arrays; lead bonding; palladium compounds; semiconductor device manufacture; DOE; EPO; FAB formation; HVM robustness; PdCu; TBGA package; ball bond process; capacitance effect enhancement; capillary; coating material recipe; cost saving; die size reduction; electrical flame off; free air ball formation; high volume manufacturing capability; industrial level package reliability stressings; insulated wire bond process; insulation layer; leadframe standardization; manufacturing performance; optimization process; organic wire coating; plasma cleaning; process characterization; size 0.18 mum; substrate standardization; tape ball grid array; wire bond layout design; wire bond parameters; Coatings; Plasmas; Rough surfaces; Surface morphology; Surface roughness; Surface treatment; Wires; Cu wire bonding; Insulated Pd coated Cu wire; Tape BGA; ultra fine pitch;
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