A PVT variation testing and compensating method for sigle-chip digital- analog mixed TCXO

摘要

In this paper, a novel test method is proposed to compensate the PVT variation induced error for a single-chip digital-analog mixed temperature-compensated crystal oscillation (TCXO). Based on the testable design of single-chip TCXO, the on-chip verification (OCV) can be effectively realized by ordinary external test system, and the proposed method can thoroughly cover the PVT variation, therefore realize a high precision.