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The investigation of semi-insulating GaAs detectors properties after neutron irradiation

机译:中子辐照后半绝缘GaAs探测器特性的研究

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Bulk semi-insulating (SI) GaAs material due to its relatively high resistance against neutrons [1,2] seems to be an excellent candidate for fabrication of a neutron detector (e.g. neutron digital imaging). Influence of various neutron integral fluencies was studied at a set of detectors based on semi-insulating GaAs. Changes in the detection and electrical properties occurred at various neutron fluencies. Performance of the detectors before and after neutron irradiation was observed via detected spectra of241Am radionuclide source. At lower fluencies of neutrons (~1012 n/cm2) the changes in detected spectra and also in current-voltage characteristics are negligible while in the detectors bombarded with higher neutron fluencies (~1013 n/cm2) a fast degradation of detection performance occurred. With increasing fluencies, a rise in the reverse current of the detectors was observed. These observations are the most probably caused by new lattice defects in the base material or overall detector structure (electrode interfaces, surface) created by neutrons.
机译:由于其对中子的相对高阻的块状半绝缘(Si)GaAs材料似乎是用于制造中子探测器的优异候选者(例如中子数字成像)。基于半绝缘GaAs的一组检测器研究了各种中子积分流量的影响。检测和电学的变化发生在各种中子流量。通过检测到的 241 / sup> am放射性核素源的光谱观察中子辐射之前和之后的探测器的性能。在较低的中子流量(〜10 12 n / cm 2 )中,检测到的光谱和电流电压特性的变化可忽略不计,而在探测器以更高的中子轰击流量(〜10 13 n / cm 2 )发生检测性能的快速劣化。随着流利的增加,观察到探测器的反向电流的增加。这些观察结果是由基材或由中子产生的整体探测器结构(电极接口,表面)中的新晶格缺陷引起的最可能引起的。

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