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Determination of spin diffusion length in Germanium by optical and electrical spin injection

机译:光电自旋注入法测定锗中的自旋扩散长度

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We report on the measurements of spin diffusion length and lifetime in Germanium with both magneto-electro-optical and magneto-electrical techniques. Magneto-electro-optical measurements were made by optically inject in Fe/MgO/Ge spin-photodiodes a spin polarized population around the Γ point of the Brillouin zone of Ge at different photon energies. The spin diffusion length is obtained by fitting by a mathematical model the photon energy dependence of the spin signal, due to switching of the light polarization from left to right, leading to a spin diffusion length of 0.9±0.2 μm at room temperature. Non-local four-terminals and Hanle measurements performed on Fe/MgO/Ge lateral devices, at room temperature, instead lead to 1.2+0.2 μm. The compatibility of these values among the different measurement methods validates the use all of all of them to determine the spin diffusion length in semiconductors. While electrical methods are well known in semiconductor spintronics, in this work we demonstrate that the optical pumping versus photon energy is an alternative and reliable method for the determination of the spin diffusion length whereas the band structure of the semiconductor allows for a non-negligible optical spin orientation.
机译:我们用磁电光和磁电技术报告了锗中自旋扩散长度和寿命的测量结果。磁电光测量是通过在Fe / MgO / Ge自旋光电二极管中光学注入在不同光子能量下Ge的布里渊区的Γ点附近的自旋极化种群而进行的。自旋扩散长度是通过数学模型拟合自旋信号的光子能量依赖性而获得的,这归因于光偏振从左到右的切换,导致室温下的自旋扩散长度为0.9±0.2μm。在室温下,在Fe / MgO / Ge横向器件上进行的非局部四端子和Hanle测量导致1.2 + 0.2μm。这些值在不同测量方法之间的兼容性验证了使用所有这些值来确定半导体中的自旋扩散长度。尽管电方法在半导体自旋电子学中是众所周知的,但在这项工作中,我们证明了光泵浦与光子能量的关系是一种确定自旋扩散长度的替代性可靠方法,而半导体的能带结构则允许使用不可忽略的光旋转方向。

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