Electro-Optical Testing of Fully Depleted CCD Image Sensors for the Large Synoptic Survey Telescope Camera

摘要

The LSST Camera science sensor array will incorporate 189 large format Charge Coupled Device (CCD) image sensors. Each CCD will include over 16 million pixels and will be divided into 16 equally sized segments and each segment will be read through a separate output amplifier. The science goals of the project require CCD sensors with state of the art performance in many aspects. The broad survey wavelength coverage requires fully depleted, 100 micrometer thick, high resistivity, bulk silicon as the imager substrate. Image quality requirements place strict limits on the image degradation that may be caused by sensor effects: optical, electronic, and mechanical. In this paper we discuss the design of the prototype sensors, the hardware and software that has been used to perform electro-optic testing of the sensors, and a selection of the results of the testing to date. The architectural features that lead to internal electrostatic fields, the various effects on charge collection and transport that are caused by them, including charge diffusion and redistribution, effects on delivered PSF, and potential impacts on delivered science data quality are addressed.