By scattering focused radiation off an AFM tip the local THz/infrared response can be measured and mapped together with a sample's topography, at a spatial resolution down to 20 nm. This contribution will cover both monochromatic and broadband spectroscopic ("nano-FTIR" and "TD-THz") operation of scattering-type optical near-field microscopy (s-SNOM), and highlight applications including a material's conductance at THz frequencies.
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