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Surface characterization using combined analysis of original and scatter image

机译:使用原始分布图像的组合分析表面表征

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In a corresponding paper the optical design of combined microscopic and scatterometrical imaging devices is extensively discussed. The current paper deals with concepts of the necessary combined data analysis. A major problem is the fact that usually only the power distributions of both original and scatter images can be measured with arguable effort, and so both domains have to offer certain non-redundant information. Basic concepts, theoretical investigations of limitations and examples from typical applications are presented.© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
机译:在相应的纸张中,广泛地讨论了组合微观和散射图像成像装置的光学设计。目前的论文涉及必要的组合数据分析的概念。主要问题是,通常只能用可争议的努力来测量原始和散点图像的功率分布,因此两个域必须提供某些非冗余信息。提出了基本概念,介绍了典型应用的理论研究和典型应用的例子。©(2012)照片光学仪表工程师(SPIE)的版权协会。仅供个人使用的摘要下载。

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