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Fabrication and measurements of an individually addressable micro-probe electrode array using silicon through-glass via

机译:使用硅通玻璃可单独寻址的微探针电极阵列的制造和测量

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In this study, a micro-probe electrode array with independent interconnections through the substrate has been developed using LRS(Low Resistance Silicon) via and glass reflow process. The silicon vias have electrical resistance less than 2 Ω because the boron ion in the borosilicate glass wafer can diffuse into the LRS pillars during glass reflow process. The LRS wafer was etched with double DRIE (Deep Reactive Ion Etching) and RIE (Reactive Ion Etching) process to form 70 μm-height and 190 μm-pitch silicon micro-probe structures. To connect to silicon via, Cr/Au was deposited and patterned on micro-probe array structures. The Parylene-C film was deposited and patterned for insulating layer. To verify electrochemical characteristics of individually addressable micro-probe electrode array, the CV (Cyclic Voltammetry) measurement method was performed.
机译:在该研究中,已经使用LRS(低电阻硅)和玻璃回流工艺开发了一种微探针电极阵列,通过基板具有独立互连。硅通孔具有小于2Ω的电阻,因为硼硅酸盐玻璃晶片中的硼离子可以在玻璃回流过程中扩散到LRS柱中。用双DRIE(深反应离子蚀刻)和RIE(反应离子蚀刻)工艺蚀刻LRS晶片,以形成70μm高度和190μm-间距硅微探针结构。为了连接到硅通孔,在微探针阵列结构上沉积和图案化Cr / Au。沉积聚对聚膜和图案化的绝缘层。为了验证可单独寻址的微探针电极阵列的电化学特性,进行CV(环伏安法)测量方法。

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