Attempt to a non-destructive Single Event Burnout test of Fast High Current Thyristors

摘要

This paper describes an attempt to perform a non-destructive measurement of Single Event Burnout (SEB) failure rate of Fast High Current Thyristors (FHCT) when exposed to cosmic rays and to particle accelerator radiation. FHCTs are used as the power switching components of a beam abort system in the Large Hadron Collider (LHC) and their reliable operation is mandatory for the LHC safety.