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FAMe: A novel OTP NV memory cell based on a fuse-antifuse series arrangement

机译:FAMe:一种基于熔体-反熔丝串联结构的新型OTP NV存储单元

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Non-Volatile One-Time-Programmable (NV-OTP) cells are typically based on either an anti-fuse (AF) or a fuse (F) structure but rarely on a combination of both types interacting as a single circuit during programming and detection. This work introduces such a cell named FAMe for Fuse Antifuse Memory. FAMe bit cell is in essence an “OTP-inverter”, where a metal fuse and a 3-terminal Gate-Grounded isolated-NMOS antifuse are connected in series across a Power rail. High detection margins and area efficiency, lower power consumption and CMOS scalability makes it attractive for applications requiring up to 500 bit per die.
机译:非易失性一次性可编程(NV-OTP)单元通常基于反熔丝(AF)或熔丝(F)结构,但很少基于两种类型的组合在编程和检测过程中作为单个电路相互作用。这项工作为Fuse Antifuse Memory引入了一个名为FAMe的单元。 FAMe位单元本质上是一个“ OTP反相器”,其中金属保险丝和一个3端栅极接地的隔离NMOS反熔丝通过电源轨串联连接。高检测余量和面积效率,更低的功耗和CMOS可扩展性使其对于每个裸片要求高达500位的应用具有吸引力。

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