Multiple Environment Overstress Testing and Modelling of Solar Cells

摘要

Solar modules are typically qualified by conducting a sequence of industry standard tests, for example IEC 61215 and 61646. Although these tests are thorough and therefore also time consuming, the results cannot be used to determine the lifetime or make inferences about lifetime of the modules [1]. New approaches are needed to fulfil requirements as designed lifetime - typically 25 years - and time-to-market reduction. To this end we have developed a novel approach that is based on both physical testing and finite element modelling (figure 1) to increase the understanding of how parts fail and how to improve designs. Physical and numerical experiments are used in a combined way appreciating the strengths and weaknesses of both. The failure behaviour of wafer solar cells was investigated combining Multiple Environment Overstress Testing (MEOST) [2] and multi physics Finite Element Modelling (FEM). Figure 2 shows the experimental setup.