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Vibration durability of board mounted BallGridArrays

机译:板载BallGridArrays的振动耐久性

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摘要

The reliability of electrical components and their solder joints in particular, with respect to vibration, also often referred to as high cycle fatigue, becomes more and more important to customers in the automotive industry. The industry increasingly requires a guaranteed life time of the solder joints considering a defined vibration load by means of modeling and simulation due to shorter time to market cycles for electronic control units and therefore less allowance for failure during product qualification. The paper presents an accepted and efficient procedure to calculate the solder joint life time, considering a given random vibration profile for a MAPBGA and discusses its possibilities and limits. A stress-life durability model is used to estimate the reliability of board level assemblies. It is based on a combination of Basquin's law for high cycle fatigue (HCF) and Coffin-Manson law for low cycle fatigue.
机译:对于汽车行业的客户来说,电气元件及其焊点的可靠性,尤其是相对于振动的可靠性(通常也称为高循环疲劳)变得越来越重要。由于电子控制单元的上市时间较短,因此在产品鉴定过程中出现故障的可能性较小,因此,通过建模和仿真,考虑到定义的振动负载,业界越来越需要保证焊点的使用寿命。考虑到给定的MAPBGA随机振动曲线,本文提出了一种公认的有效方法来计算焊点寿命,并讨论了其可能性和局限性。应力寿命耐久性模型用于估计板级组件的可靠性。它基于Basquin高循环疲劳定律(HCF)和Coffin-Manson低循环疲劳定律的组合。

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