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Optical Deformation Measurement for Validation of Thermo-Mechanical FEM Models and Material Behavior in Electronics

机译:用于验证热机械有限元模型和电子产品的材料行为的光学变形测量

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The application of virtual evaluation tools based on the Finite Element Method (FEM) is already widespread in the field of electronics. At the assembly level, the geometries and material compositions of these models are often very complex and predominantly non-linear. To ensure the validity of the structural mechanic simulation models, it is always advisable to compare the calculation results with real measured data of experiment. This validation allows the evaluation of the model quality, provides information about the limits of material models and increases the credibility of the calculation results. One possibility for experimental verification is the optical measurement of the deformations and evaluation by digital image correlation. In this paper, optical measurement setups are presented, which have been specifically designed for the measurement of the thermo-mechanical deformation field on the structures of electronics and their assembly and interconnection technology. Therefore, the measurement setup needs to detect deformations in the range of a few micrometers in a wide temperature range. The physical understanding of the transient heating of the test specimen is essential for the accuracy of the deformation fields to be determined. Two suitable setups are shown. One is for smaller samples like packages (ODU-1) while the second one ODU-2 has been designed with PCB-board size samples in mind. ODU-1 has been accompanied by numerical flow simulation (CFD) to combine a good understanding of fluid mechanics with the transient thermo-mechanics of the test specimen. Based on the simulation results and measurements of test specimens, measures were derived and implemented to achieve the necessary high measurement accuracy. Deep understanding of the accuracy of deformation measurements has shown that a temperature ramp of 1K/min is a good compromise between speed and accuracy. The measurements were carried out on samples designed for future power electronics applications and consisted of thick copper and polymer crossings with a novel technology. The measured deformation fields agree well with the calculations of the corresponding FE models at the same thermo-mechanical load. Furthermore, the shown measurements indicate crack development due to environmental loads. These cracks could be detected with DIC and were also evident in x-ray inspection. This leads to the conclusion that optical deformation measurement is a valuable tool in reliability analysis to support simulation verification and also support inspections towards interface cracking.
机译:基于有限元方法(FEM)的虚拟评估工具在电子领域中的应用已经很广泛。在组装水平,这些模型的几何形状和材料组合物通常非常复杂,主要是非线性的。为确保结构技工仿真模型的有效性,始终建议使用实验的实际测量数据进行比较计算结果。该验证允许评估模型质量,提供有关材料模型限制的信息,并提高了计算结果的可信度。实验验证的一种可能性是通过数字图像相关性的变形和评估的光学测量。在本文中,提出了光学测量设置,专门用于测量电子及其组装和互连技术结构上的热机械变形场。因此,测量设置需要在宽温度范围内检测几微米范围内的变形。对试样的瞬态加热的物理理解对于要确定的变形场的准确性至关重要。显示了两个合适的设置。一个是较小的样本,如封装(ODU-1),而第二个ODU-2一直设计有考虑PCB板尺寸样本的。 ODU-1一直伴随着数值流动模拟(CFD),以便将流体力学的良好理解与试样的瞬态热电部件相结合。基于试样的仿真结果和测量,得到和实施措施,以实现必要的高测量精度。深入了解变形测量的准确性,表明1K / min的温度斜坡是速度和精度之间的良好折衷。测量是对设计用于未来电力电子应用的样本,并由具有新技术的厚铜和聚合物交叉组成。测量的变形领域在相同的热机械负载下的相应FE模型的计算中吻合良好。此外,所示的测量表明由于环境负荷导致的裂纹开发。可以用DIC检测这些裂缝,并且在X射线检查中也明显。这导致结论是光学变形测量是可靠性分析中的有价值的工具,以支持模拟验证,并支持对界面开裂的检查。

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