首页> 外文会议>International Symposium on Quality Electronic Design >Flash ADC Utilizing Offset Voltage Variation With Order Statistics Based Comparator Selection
【24h】

Flash ADC Utilizing Offset Voltage Variation With Order Statistics Based Comparator Selection

机译:闪存ADC利用基于订单统计的比较器选择的偏移电压变化

获取原文

摘要

High-speed flash ADCs are required for wireless communication systems. However, the trade-off between area, power, and linearity suffers severely by offset voltage variation in sub-micron process. This paper proposes a flash ADC architecture that utilizes the offset voltage variation to reduce area and power consumption by eliminating reference generation. The proposed architecture utilizes offset voltages as references by selecting the appropriate comparators after an on-chip calibration. The on-chip calibration is performed based on order statistics that allows evaluating offset voltages in the time-domain. We verify our proposed architecture by HSPICE simulation based on a commercial 65 nm process. Our proposed architecture realizes a 5-bit ADC with the power consumption of less than 1 mW at 2 GS/s of operation, excluding the encoder.
机译:无线通信系统需要高速闪光ADC。 然而,面积,功率和线性度之间的权衡受亚微米工艺中的偏移电压变化严重影响。 本文提出了一种利用偏移电压变化来降低面积和功耗来减少参考生成的闪存ADC架构。 通过在片上校准后选择相应的比较器,所提出的架构利用偏移电压作为参考。 基于允许评估时域中的偏移电压的顺序统计来执行片上校准。 我们通过基于商业65纳米工艺的HSPICE仿真来验证我们提出的架构。 我们所提出的架构实现了5位ADC,功耗低于2GS / s的操作,不包括编码器。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号