Low-cost system for full-wafer photoluminescence characterization of photovoltaic silicon

摘要

Photoluminescence imaging technique has recently emerged as a powerful tool for obtaining very quick sorting of silicon based solar wafers and cells. In this work, we report on a low-cost photoluminescence imaging system, paying special attention to the different constituting elements. Results on both commercial multicrystalline (mc) and seed-monocast (sm) Si wafers and solar cells are discussed.