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Terahertz detection using Si-SiGe MODFETs

机译:太赫兹使用Si-SiGe Modfets检测

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We report on resonant and non-resonant (broad-band) detection of terahertz (THz) radiation using Strained-Si MODFETs. The devices were excited at room temperature by two types of THz sources at 0.292 THz and at 1.5 THz. Non-resonant response with maxima around the threshold voltage was observed. Shubnikov-de Haas along with photoresponse measurements were performed simultaneously to demonstrate that the observed response is related to the plasma waves oscillation in the channel. The device was cooled down to 4.2 K and resonant signature could be observed.
机译:我们通过应变Si ModFET报告Terahertz(THz)辐射的谐振和非共振(宽带)检测。将器件在室温下在0.292至THz的两种THz来源在1.5至THz时兴奋。观察到围绕阈值电压的最大值的非共振响应。同时进行Shubnikov-de Haas以及光孔测量,以证明观察到的响应与通道中的等离子体波振荡有关。将该装置冷却至4.2k,并且可以观察到共振签名。

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