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Effect of electric field and temperature variability on spin dephasing in SiGe nanowires

机译:电场和温度变异性对SiGe纳米线旋转去除的影响

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In this paper, we use semi classical Monte Carlo method to investigate Effect of electric field and temperature variability on spin polarized transport in SiGe nanowires (SiGeNWs) with Ge mole fraction of 0.2, 0.4, 0.6 and 0.8. We use a multi-subbands semi classical Monte Carlo approach to model spin dephasing. Monte Carlo simulations have been widely adopted to study electron transport in devices and have recently been used in conjunction with spin density matrix calculations to model spin transport. Spin dephasing in SiGe nanowires (SiGeNWs) is caused due to D'yakonov-Perel (DP) relaxation and due to Elliott-Yafet (EY) relaxation. The components of ensemble averaged spin variation have been studied for SiGe nanowires (SiGeNWs) along the nanowires length. The effect of variation of electric field and temperature on spin dephasing length has been studied. It is found that variation of the electric field does not affect spin dephasing length significantly but spin dephasing length decrease as Ge mole fraction increases from 0.2 to 0.8 for the same value of electric field in SiGe nanowires (SiGeNWs). The effect of variation of temperature is more visible and as temperature increases from 10K to 300K spin dephasing length decrease due to dominant increase of acoustic phonon scattering and it decrease more dominantly for higher value of Ge mole fraction such as 0.8 compare to 0.2.
机译:在本文中,我们使用半古典蒙特卡罗方法来研究电场和温度可变性在SiGe纳米线(SigeNW)中的旋转偏振输送的影响,Ge摩尔分数为0.2,0.4,0.6和0.8。我们使用多个子带半古典蒙特卡罗方法来模拟旋转去除。蒙特卡罗模拟已被广泛采用以研究设备中的电子传输,并且最近与旋转密度矩阵计算结合使用以进行模型旋转运输。在SiGe纳米线(SigeNws)中旋转脱模是由于D'Yakonov-Perel(DP)放松引起的,并且由于Elliott-Yafet(Ey)放松而导致。已经研究了沿纳米线长度的SiGe纳米线(SigeNW)研究了集合平均自旋变化的组分。研究了电场和温度变化对旋转扩展长度的影响。结果发现电场的变化不会显着影响旋转脱位长度,但随着Ge摩尔分数从0.2至0.8增加到SiGe纳米线(SigeNW)中的电场相同的值增加0.2至0.8,旋转脱位长度降低。温度变化的效果更可见,随着声学声子散射的主要增加,温度从10k到300k的旋转去除长度减小,并且对于更高的Ge摩尔分数,例如0.8比较为0.8,因此较高的葛摩尔分数较高的速度下降。

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