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Dynamic current activity measurement for integrated circuit emission model

机译:集成电路发射模型的动态电流活动测量

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This paper describes the current activity measurement and modeling of integrated circuits for electromagnetic conducted emission. In this study, a test circuit including the MC9S12XMAG-family microcontroller was designed and measurements were made to confirm the applied measurement techniques. Moreover, internal current was obtained from the measured external current which is described as a dynamic current activity on the die. The input impedance measurements were performed in the frequency range from 1MHz to 2GHz. The passive distribution network was extracted with the differential evolution algorithm from the measured impedance - frequency curve and results were compared with the measurements. The external current was measured by the spectrum analyzer has been used to obtain the internal current of the die. Extracted passive distribution network and internal activity component values have been given to obtain the integrated circuit emission model.
机译:本文描述了用于电磁传导发射的集成电路的当前活动性测量和建模。在这项研究中,设计了包括MC9S12XMAG系列微控制器的测试电路,并进行了测量以确认所应用的测量技术。而且,从测量的外部电流获得内部电流,该内部电流被描述为管芯上的动态电流活动。输入阻抗测量在1MHz至2GHz的频率范围内进行。使用差分进化算法从测量的阻抗-频率曲线中提取无源配电网,并将结果与​​测量结果进行比较。通过频谱分析仪测量的外部电流已用于获得芯片的内部电流。给出了提取的无源配电网和内部活动分量值,以获得集成电路发射模型。

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