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3-D Finite-Element Modeling of Multi-Finger High-Power Amplifiers With Compact Heat-Dissipation Packaging Structures

机译:具有紧凑型散热包装结构的多指大功率放大器的3-D有限元建模

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High-power amplifiers (HPAs) for wireless communication systems have shown significant progress in recent years and the interests for HPA-based dual-band systems are growing rapidly [1]. Miniaturizing HPAs is needed for future multi-band cellular phones. Due to the high-power density and high-linearity characteristics [2], the heterojunction bipolar transistor (HBT) is promising for HPA applications. The miniaturization of HPAs depends mainly on thermal management of HBTs. Conventional HPAs employing emitter-up HBTs suffer from large collector capacitance which limits RF performance. Besides, their thermal resistance is large because heat dissipates mostly through emitter wiring. Thus, special thermal designs, such as ballast resistors, thermal shunts, and wide finger pitches, have been required to improve thermal conduction. In the other respect, HPAs composed of collector-up HBTs, whose collector capacitance is much smaller than that of emitter-up HBTs, exhibit better RF performance [3]. Moreover, in the collector-up HBT with a heat-dissipation configuration, heat dissipates directly from the thermal via, so that collector finger pitches can be minimized. We develop a 3-D finite-element model (FEM) to analyze thermal performance in collector-up (C-up) HBTs and to conduct the miniaturization design of heat-dissipation packaging structures underneath collector fingers. It is shown that numerical methods are most appropriate for developing heat-dissipation structures in HBTs [4]. For this advanced packaging-technology analysis, the FEM methodology was used to calculate temperature distributions around the transistor by adjusting the thickness of plated heat sink (PHS) layer. Also the maximum operation temperature in the three-finger collector-up HBT with different finger pitches was examined. In this study, the results are demonstrated on the GaInP C-up HBT, which is a potential candidate for used in advanced HPAs owing to its low-power supply voltages and high-power handling capability [5].
机译:无线通信系统的高功率放大器(HPA)在近年来近年来的显着进展,并且基于HPA的双频系统的利益正在快速增长[1]。未来的多频段手机需要小型化HPA。由于高功率密度和高线性特性[2],异质结双极晶体管(HBT)对HPA应用有前途。 HPA的小型化主要取决于HBT的热管理。采用发光HBT的常规HPA患有大型收集电容,限制RF性能。此外,它们的热阻很大,因为热量主要通过发射极布线耗散。因此,需要特殊的热设计,例如压载电阻,热分流器和宽手指间距来改善热传导。在另一个方面,由集电极HBT组成的HPA,其集电极电容远小于发射HBT的电容远小,表现出更好的RF性能[3]。此外,在具有散热配置的集电极 - 上的HBT中,热量从热通孔散发,从而可以最小化收集器手指距离。我们开发了一个三维有限元模型(FEM),以分析集电体(C-UP)HBT的热性能,并在收集器手指下进行散热包装结构的小型化设计。结果表明,数值方法最适合于在HBT [4]中发育热耗散结构。对于这种先进的包装技术分析,通过调节镀覆散热器(PHS)层的厚度来使用FEM方法来计算晶体管周围的温度分布。还检查了三指聚集体HBT中的最大操作温度,具有不同的手指间距。在这项研究中,在GAINP C-UP HBT上证明了结果,这是由于其低电源电压和高功率处理能力而在高级HPA中使用的潜在候选者[5]。

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