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Design of Measurement System for Low Illuminance CCD's Key Performance Parameters

机译:低照度CCD关键性能参数测量系统设计

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As an important photovoltaic detector in the night vision imaging systems, some main performance parameters decide the properties of the low illuminance CCDs greatly including noise, quantum effects, dynamic range and dark current, and it is necessary to design a measurement system to measure the performance parameters of the low illuminance CCD. This article designs a set of low illuminance CCD chips' performance parameter measurement system, which is consisted of five parts including adjustable monochromatic light source, integrating sphere-darkroom, Dewar control chamber, main control circuit and the master computer software for automatic measurement. By persistent demonstration, the performance parameters measurement system which is focused on the low illuminance CCD proposed in this paper has the advantages of compact, good compatibility, theoretical measurement precision and fully automated measurement etc.The appropriate equipment and instruments are selected in this measurement system. And the connections of each subsystem are designed independently, which guarantees the tightness of the total system, eliminate the effects of stray light at the same time and improves the measurement accuracy of the system. Besides, this measurement system solves the generation of monochromatic light, and the measurement of low illuminance CCDs at a low temperature.
机译:作为夜视成像系统中重要的光电探测器,一些主要性能参数决定了低照度CCD的特性,包括噪声,量子效应,动态范围和暗电流,因此有必要设计一种测量系统来测量其性能。低照度CCD的参数。本文设计了一套低照度CCD芯片性能参数测量系统,该系统由五个部分组成,包括可调单色光源,积分球暗室,杜瓦控制室,主控制电路和用于自动测量的主计算机软件。经过不断的论证,本文提出的针对低照度CCD的性能参数测量系统具有结构紧凑,兼容性好,理论测量精度高和全自动测量等优点,在该测量系统中选择了合适的设备和仪器。 。每个子系统的连接均独立设计,保证了整个系统的紧密性,同时消除了杂散光的影响,提高了系统的测量精度。此外,该测量系统解决了单色光的产生以及低温下低照度CCD的测量问题。

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