首页> 外文会议>International symposium on photoelectronic detection and imaging >Intensity information extraction in Geiger mode detector array based three dimensional imaging applications
【24h】

Intensity information extraction in Geiger mode detector array based three dimensional imaging applications

机译:基于Geiger模式探测器阵列的三维成像中的强度信息提取

获取原文

摘要

Geiger-mode detectors have single photon sensitivity and picoseconds timing resolution, which make it a good candidate for low light level ranging applications, especially in the case of flash three dimensional imaging applications where the received laser power is extremely limited. Another advantage of Geiger-mode APD is their capability of large output current which can drive CMOS timing circuit directly, which means that larger format focal plane arrays can be easily fabricated using the mature CMOS technology. However Geiger-mode detector based FPAs can only measure the range information of a scene but not the reflectivity. Reflectivity is a major characteristic which can help target classification and identification. According to Poisson statistic nature, detection probability is tightly connected to the incident number of photon. Employing this relation, a signal intensity estimation method based on probability inversion is proposed. Instead of measuring intensity directly, several detections are conducted, then the detection probability is obtained and the intensity is estimated using this method. The relation between the estimator's accuracy, measuring range and number of detections are discussed based on statistical theory. Finally Monte-Carlo simulation is conducted to verify the correctness of this theory. Using 100 times of detection, signal intensity equal to 4.6 photons per detection can be measured using this method. With slight modification of measuring strategy, intensity information can be obtained using current Geiger-mode detector based FPAs, which can enrich the information acquired and broaden the application field of current technology.
机译:盖革模式探测器具有单光子灵敏度和皮秒定时分辨率,这使其成为低光范围测距应用的良好候选者,特别是在闪光三维成像应用中,接收到的激光功率受到极大限制。 Geiger模式APD的另一个优势是它们具有大输出电流的能力,可以直接驱动CMOS时序电路,这意味着可以使用成熟的CMOS技术轻松制造更大格式的焦平面阵列。但是,基于Geiger模式检测器的FPA只能测量场景的范围信息,而不能测量反射率。反射率是可以帮助目标分类和识别的主要特征。根据泊松统计性质,检测概率与光子的入射数紧密相关。利用这种关系,提出了一种基于概率倒置的信号强度估计方法。代替直接测量强度,进行几次检测,然后获得检测概率并使用此方法估算强度。基于统计理论,讨论了估计量的准确性,测量范围和检测次数之间的关系。最后进行了蒙特卡洛仿真,以验证该理论的正确性。使用100次检测,可以使用此方法测量每次检测等于4.6个光子的信号强度。通过略微修改测量策略,可以使用当前基于盖革模式检测器的FPA获得强度信息,这可以丰富所获取的信息并拓宽当前技术的应用领域。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号